Invention Grant
- Patent Title: Inspection system for limited access spaces
- Patent Title (中): 有限访问空间的检查系统
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Application No.: US10252040Application Date: 2002-09-23
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Publication No.: US07359042B2Publication Date: 2008-04-15
- Inventor: Yuval Ovadia
- Applicant: Yuval Ovadia
- Applicant Address: IL Shefayim
- Assignee: S.T.I. Security Technology Integration Ltd
- Current Assignee: S.T.I. Security Technology Integration Ltd
- Current Assignee Address: IL Shefayim
- Agency: Pearl Cohen Zedek Latzer, LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A limited access space inspection system comprising: an imaging device for imaging a region in the limited access space, a mounting for mounting the imaging device to scan about the limited access space and a scanning control unit, associated with the imaging device, for controlling the imaging device to scan about the limited access space. The device is particularly useful for improving by automation, security checks customs checks and safety checks involving such awkward to access spaces.
Public/Granted literature
- US20040057042A1 Inspection system for limited access spaces Public/Granted day:2004-03-25
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