Invention Grant
US07403285B2 Apparatus and method for measuring optical characteristics of an object
失效
用于测量物体的光学特性的装置和方法
- Patent Title: Apparatus and method for measuring optical characteristics of an object
- Patent Title (中): 用于测量物体的光学特性的装置和方法
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Application No.: US11085934Application Date: 2005-03-21
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Publication No.: US07403285B2Publication Date: 2008-07-22
- Inventor: Wayne D Jung , Russell W. Jung , Alan R. Loudermilk
- Applicant: Wayne D Jung , Russell W. Jung , Alan R. Loudermilk
- Applicant Address: US IL Morton Grove
- Assignee: JJL Technologies LLC
- Current Assignee: JJL Technologies LLC
- Current Assignee Address: US IL Morton Grove
- Agency: Loudermilk & Associates
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
A method for determining spectral characteristics of an object is disclosed. A probe is positioned in proximity relative to the object. The probe provides light from at least first and second light sources positioned first and second distances from a central light receiver. The first light source and the central light receiver define a first critical height from the surface below which no specularly reflected light from the first light source is received by the central light receiver, and the second light source and the central light receiver define a second critical height from the surface below which no specularly reflected light from the second light source is received by the central light receiver. The first critical height is different from the second critical height.
Public/Granted literature
- US20050168742A1 Apparatus and method for measuring optical characteristics of an object Public/Granted day:2005-08-04
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