Invention Grant
- Patent Title: Method of forming a through-substrate interconnect
- Patent Title (中): 形成贯通基板互连的方法
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Application No.: US11012603Application Date: 2004-12-14
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Publication No.: US07432582B2Publication Date: 2008-10-07
- Inventor: Diane Lai , Samson Berhane , Barry C. Snyder , Ronald A. Hellekson , Hubert Vander Plas
- Applicant: Diane Lai , Samson Berhane , Barry C. Snyder , Ronald A. Hellekson , Hubert Vander Plas
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: H01L29/06
- IPC: H01L29/06

Abstract:
A method of manufacturing a microelectronics device is provided, wherein the microelectronics device is formed on a substrate having a frontside and a backside. The method comprises forming a circuit element on the frontside of the substrate from a plurality of layers deposited on the frontside of the substrate, wherein the plurality of layers includes an intermediate electrical contact layer, and forming an interconnect structure after forming the electrical contact layer. The interconnect structure includes a contact pad formed on the backside of the substrate, and a through-substrate interconnect in electrical communication with the contact pad, wherein the through-substrate interconnect extends from the backside of the substrate to the electrical contact layer.
Public/Granted literature
- US20050101040A1 Method of forming a through-substrate interconnect Public/Granted day:2005-05-12
Information query
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