Invention Grant
- Patent Title: Low stress conductive polymer bump
- Patent Title (中): 低应力导电聚合物凸块
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Application No.: US11538823Application Date: 2006-10-05
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Publication No.: US07442878B2Publication Date: 2008-10-28
- Inventor: William E. Bernier , Marie S. Cole , Mukta G. Farooq , John U. Knickerbocker , Tasha E. Lopez , Roger A. Quon , David J. Welsh
- Applicant: William E. Bernier , Marie S. Cole , Mukta G. Farooq , John U. Knickerbocker , Tasha E. Lopez , Roger A. Quon , David J. Welsh
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Gibb & Rahman, LLC
- Agent Joseph Petrokaitis, Esq.
- Main IPC: H05K1/16
- IPC: H05K1/16

Abstract:
Disclosed is a laminated (or non-laminated) conductive interconnection for joining an integrated circuit device to a device carrier, where the conductive interconnection comprises alternating metal layers and polymer layers. In addition, the polymer can include dendrites, metal projections from the carrier or device, and/or micelle brushes on the outer portion of the polymer. The polymer layers include metal particles and the alternating metal layers and polymer layers form either a cube-shaped structure or a cylinder-shaped structure.
Public/Granted literature
- US20070084629A1 LOW STRESS CONDUCTIVE POLYMER BUMP Public/Granted day:2007-04-19
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