Invention Grant
- Patent Title: Self-calibrating optical reflectance probe system
- Patent Title (中): 自校准光学反射探测系统
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Application No.: US11770180Application Date: 2007-06-28
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Publication No.: US07477376B2Publication Date: 2009-01-13
- Inventor: Terrance R. Kinney
- Applicant: Terrance R. Kinney
- Applicant Address: US IN South Bend
- Assignee: Control Development Incorporated
- Current Assignee: Control Development Incorporated
- Current Assignee Address: US IN South Bend
- Agency: Hartman & Hartman, P.C.
- Agent Gary M. Hartman; Domenica N.S. Hartman
- Main IPC: G01N21/01
- IPC: G01N21/01

Abstract:
A self-calibrating optical reflectance probe system having an illuminant light source to illuminate a sample material, optical pickup means to collect reflected light from the sample material, and an articulated white reference reflection standard for illuminant reference to provide a system capable of accurately measuring optical reflectance and automated verification of proper operation. The probe system preferably employs an uncomplicated mount using a single pipe fitting and clamp.
Public/Granted literature
- US20080013085A1 SELF-CALIBRATING OPTICAL REFLECTANCE PROBE SYSTEM Public/Granted day:2008-01-17
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