Invention Grant
US07541583B2 Infrared detecting apparatus and infrared imaging apparatus using the same
失效
红外线检测装置及使用其的红外线摄像装置
- Patent Title: Infrared detecting apparatus and infrared imaging apparatus using the same
- Patent Title (中): 红外线检测装置及使用其的红外线摄像装置
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Application No.: US11723142Application Date: 2007-03-16
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Publication No.: US07541583B2Publication Date: 2009-06-02
- Inventor: Shigeru Tohyama
- Applicant: Shigeru Tohyama
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2006-075122 20060317
- Main IPC: G01J5/00
- IPC: G01J5/00
Abstract:
An infrared detecting apparatus includes: a substrate; an infrared detector which detects infrared radiation; a first supporting member which extends between the infrared detector and the substrate, and which supports the infrared detector apart from the substrate; a second supporting member which extends between the infrared detector and the substrate, and which supports the infrared detector apart from the substrate; and a plurality of wirings which extend between the infrared detector and the substrate, and which are all provided to the first supporting member.
Public/Granted literature
- US20070215807A1 Infrared detecting apparatus and infrared imaging apparatus using the same Public/Granted day:2007-09-20
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