Invention Grant
- Patent Title: Device and method for monitoring solid-state detectors
- Patent Title (中): 用于监控固态探测器的装置和方法
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Application No.: US12052860Application Date: 2008-03-21
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Publication No.: US07560682B2Publication Date: 2009-07-14
- Inventor: Mathias Hoernig
- Applicant: Mathias Hoernig
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Schiff Hardin LLP
- Priority: DE102007013620 20070321
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01T1/24
Abstract:
In a device and associated method for monitoring solid-state detectors, image segments of a test image (such as, for example, a dark current image) from solid-state detectors are evaluated and further usability of the solid-state detector is indicated using assessment criteria.
Public/Granted literature
- US20080232555A1 DEVICE AND METHOD FOR MONITORING SOLID-STATE DETECTORS Public/Granted day:2008-09-25
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