Invention Grant
- Patent Title: Charged particle beam scanning method and charged particle beam apparatus
- Patent Title (中): 带电粒子束扫描法和带电粒子束装置
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Application No.: US11892332Application Date: 2007-08-22
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Publication No.: US07598497B2Publication Date: 2009-10-06
- Inventor: Kouichi Yamamoto , Kaneo Kageyama
- Applicant: Kouichi Yamamoto , Kaneo Kageyama
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-235869 20060831
- Main IPC: H01J37/26
- IPC: H01J37/26

Abstract:
A method and an apparatus for calculating a scan signal so that the scan region becomes a scan region which is based on magnification ratio between desired magnification in a scan-line interval direction and desired magnification in a scan-line direction, and performing a calculation for rotating the scan direction with respect to the scan signal in order to suppress a distortion which is caused to occur when the technology where the scan direction of a charged particle beam is rotated is applied to the technology where the charged particle beam is scanned such that the scan-line interval is enlarged.
Public/Granted literature
- US20080054187A1 Charged particle beam scanning method and charged particle beam apparatus Public/Granted day:2008-03-06
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