Invention Grant
US07598497B2 Charged particle beam scanning method and charged particle beam apparatus 有权
带电粒子束扫描法和带电粒子束装置

Charged particle beam scanning method and charged particle beam apparatus
Abstract:
A method and an apparatus for calculating a scan signal so that the scan region becomes a scan region which is based on magnification ratio between desired magnification in a scan-line interval direction and desired magnification in a scan-line direction, and performing a calculation for rotating the scan direction with respect to the scan signal in order to suppress a distortion which is caused to occur when the technology where the scan direction of a charged particle beam is rotated is applied to the technology where the charged particle beam is scanned such that the scan-line interval is enlarged.
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