Invention Grant
US07640675B2 Method for measuring tools with a measuring device, and measuring apparatus with a measuring device for measuring tools
有权
用测量装置测量工具的方法，以及具有用于测量工具的测量装置的测量装置
- Patent Title: Method for measuring tools with a measuring device, and measuring apparatus with a measuring device for measuring tools
- Patent Title (中): 用测量装置测量工具的方法，以及具有用于测量工具的测量装置的测量装置
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Application No.: US11839801Application Date: 2007-08-16
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Publication No.: US07640675B2Publication Date: 2010-01-05
- Inventor: Wolfgang Madlener , Wilfried Veil
- Applicant: Wolfgang Madlener , Wilfried Veil
- Applicant Address: DE Waldburg
- Assignee: M&H Inprocess Messtechnik GmbH
- Current Assignee: M&H Inprocess Messtechnik GmbH
- Current Assignee Address: DE Waldburg
- Agency: Burr & Brown
- Priority: DE102006039258 20060822
- Main IPC: B23Q17/22
- IPC: B23Q17/22 ; G01B21/00
Abstract:
A method is proposed for measuring tools on a machine tool with a measuring device, wherein by means of a movement of a spindle of the machine tool the measuring device is temporarily positioned at a measuring point on the machine tool in order to carry out one or more measurements, the measuring point differing from a spindle mount. Furthermore, a measuring apparatus is proposed which is embodied in such a way that the measuring device can be positioned at a measuring point on the machine tool for a measuring operation by means of a spindle movement of a machine tool, said measuring point differing from a spindle mount.
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