Invention Grant
- Patent Title: Storage device, and writing unit diagnosing method
- Patent Title (中): 存储设备和书写单元诊断方法
-
Application No.: US11699628Application Date: 2007-01-30
-
Publication No.: US07642789B2Publication Date: 2010-01-05
- Inventor: Nobuyoshi Yamasaki , Masao Kondo
- Applicant: Nobuyoshi Yamasaki , Masao Kondo
- Applicant Address: JP Tokyo
- Assignee: Toshiba Storage Device Corporation
- Current Assignee: Toshiba Storage Device Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greer, Burns & Crain, Ltd.
- Priority: JP2006-266378 20060929
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G06F11/00 ; G11B5/09

Abstract:
The present invention provides a storage device and a writing unit diagnosing method, which can determine a defect in a writing unit at an early stage. There is provided a storage device, which includes writing units that write data to a storage medium, current application units that apply a current to the writing units, electric property measurement units that measure the electric property of the writing units at the time of applying a current by the current application units, and obtain electric property measured values, a storage unit that stores the electric property measured values obtained by the electric property measurement units, and a judgment unit that judges whether or not the writing units are abnormal based on the electric property measured values stored in the storage unit.
Public/Granted literature
- US20080079438A1 Storage device, and writing unit diagnosing method Public/Granted day:2008-04-03
Information query