Invention Grant
- Patent Title: Testing high frequency signals on a trace
- Patent Title (中): 测试轨迹上的高频信号
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Application No.: US12334992Application Date: 2008-12-15
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Publication No.: US07642804B2Publication Date: 2010-01-05
- Inventor: George Tang
- Applicant: George Tang
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Cochran Freund & Young LLC
- Agent William W. Cochran
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A system, apparatus and method for testing and measuring high frequency signals on a trace is described. In one embodiment of the invention, a footprint is manufactured on a trace to allow the testing of a signal while reducing the amount of distortion caused by prior art structures and methods. The footprint is designed to reduce stub effects and capacitance on a signal being communicated on the trace.
Public/Granted literature
- US20090128184A1 Testing High Frequency Signals on a Trace Public/Granted day:2009-05-21
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