Invention Grant
- Patent Title: Test apparatus, system, and method with a magnetic feature
- Patent Title (中): 具有磁特性的测试装置,系统和方法
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Application No.: US11549587Application Date: 2006-10-13
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Publication No.: US07642806B2Publication Date: 2010-01-05
- Inventor: Zbigniew S. Piec , David E. Corbett , Alan R. Langhorn
- Applicant: Zbigniew S. Piec , David E. Corbett , Alan R. Langhorn
- Applicant Address: US CA San Diego
- Assignee: General Atomics
- Current Assignee: General Atomics
- Current Assignee Address: US CA San Diego
- Agency: Fitch, Even, Tabin & Flannery
- Main IPC: G01R31/34
- IPC: G01R31/34

Abstract:
A magnetic test apparatus, in accordance with one embodiment, comprising a rotor coupled to a drive shaft, wherein the drive shaft is mechanically coupled to a drive system; a stator coupled to at least one brush holder; at least one brush held by the brush holder, wherein the brush is held in contact with the rotor; a housing for supporting the rotor and the stator; and a magnet for providing a magnetic field in the vicinity of the at least one brush.
Public/Granted literature
- US20080150572A1 Magnetic test apparatus Public/Granted day:2008-06-26
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