Invention Grant
- Patent Title: Duty detection circuit
- Patent Title (中): 占空比检测电路
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Application No.: US12010670Application Date: 2008-01-29
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Publication No.: US07642829B2Publication Date: 2010-01-05
- Inventor: Atsuko Monma , Kanji Oishi
- Applicant: Atsuko Monma , Kanji Oishi
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2005-027483 20050203
- Main IPC: H03K3/017
- IPC: H03K3/017 ; H03K5/04 ; H03K7/08

Abstract:
A duty detection circuit includes an integration circuit for receiving an RCLK signal and an FCLK signal that are internal clock signals generated by a DLL circuit, and generating voltage levels in accordance with the duty ratio of these internal clock signals; an amplifier for amplifying the output of the integration circuit; a latch circuit for latching the output of the amplifier; a control circuit for controlling the operation timings of each component; a bias circuit for feeding a BIAS signal to the integration circuit; and a frequency monitor circuit unit for monitoring the frequency of the clock signal. The frequency monitor circuit unit is a circuit component used when the power source is turned on, during resetting, and when other initial settings are performed, and detects the actual frequency of the clock signal and adjusts the amount of charging or discharging of the capacitors C1 through C4 in the integration circuit according to this actual frequency.
Public/Granted literature
- US20080129358A1 Duty detection circuit Public/Granted day:2008-06-05
Information query
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