Invention Grant
- Patent Title: Particle image analyzing apparatus
- Patent Title (中): 粒子图像分析装置
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Application No.: US11803604Application Date: 2007-05-15
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Publication No.: US07643143B2Publication Date: 2010-01-05
- Inventor: Kozo Fujii , Katsuaki Yamaguchi
- Applicant: Kozo Fujii , Katsuaki Yamaguchi
- Applicant Address: JP Kobe-shi
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe-shi
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2006-135033 20060515
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G06K9/56

Abstract:
A particle image analyzing apparatus for analyzing an image of an imaged particle, the particle image analyzing apparatus comprising: an illuminating unit for providing dark field illumination the a particle; an imaging unit for acquiring capturing an imaged image by imaging the dark field illuminated particle; and an image processing unit for extracting a particle image from the imaged image captured by the imaging unit, based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image, and analyzing the extracted particle image to obtain morphological feature information indicating the morphological feature of the particle; wherein the image processing unit extracts the particle image from the imaged image based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image.
Public/Granted literature
- US20070273878A1 Particle image analyzing apparatus Public/Granted day:2007-11-29
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