Invention Grant
- Patent Title: Phase shift amount measurement apparatus and transmittance measurement apparatus
- Patent Title (中): 相移量测量装置和透射率测量装置
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Application No.: US12005882Application Date: 2007-12-28
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Publication No.: US07643157B2Publication Date: 2010-01-05
- Inventor: Hideo Takizawa , Koji Miyazaki , Haruhiko Kusunose
- Applicant: Hideo Takizawa , Koji Miyazaki , Haruhiko Kusunose
- Applicant Address: JP Kanagawa
- Assignee: Lasertec Corporation
- Current Assignee: Lasertec Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Carrier, Blackman & Associates, P.C.
- Agent Joseph P. Carrier; William D. Blackman
- Priority: JP2007-000098 20070104; JP2007-339148 20071228
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A phase shift amount measurement apparatus able to further correctly measure a phase shift amount of a phase shifter, wherein a laterally offset interference image of a phase shift mask is formed by a shearing interferometer, the interference image is captured by a two-dimensional imaging device, an output signal output from each light receiving element of the two-dimensional imaging device is supplied to a signal processing device, the phase shift amount is calculated for each light receiving element, the light receiving area of the light receiving element is very small, therefore the phase shift amount of any light receiving element outputting a peculiar phase amount due to incidence of diffraction light or multi-reflection light is excluded and the phase shift amount is determined based on the phase shift amount found from output signals of the remaining light receiving elements.
Public/Granted literature
- US20080174786A1 Phase shift amount measurement apparatus and transmittance measurement apparatus Public/Granted day:2008-07-24
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