Invention Grant
US07643666B2 Method and apparatus for angular-resolved spectroscopic lithography characterization 失效
用于角分辨光谱光刻特征的方法和装置

Method and apparatus for angular-resolved spectroscopic lithography characterization
Abstract:
Reconstruction of an object by which radiation is diffracted is disclosed. Specifically, the reconstruction includes: estimating the object shape; deriving a model diffraction pattern from the estimated shape; illuminating the object with radiation; detecting a diffraction pattern of radiation diffracted by the object; comparing the model diffraction pattern and the detected diffraction pattern; and determining the actual object shape from the difference between the model diffraction pattern and the detected diffraction pattern, wherein the model diffraction pattern is determined using Bloch Mode Expansion.
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