Invention Grant
- Patent Title: Bisect de-embedding for network analyzer measurement
- Patent Title (中): 用于网络分析仪测量的等分线去嵌入
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Application No.: US11222604Application Date: 2005-09-09
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Publication No.: US07643957B2Publication Date: 2010-01-05
- Inventor: Erik S. Daniel
- Applicant: Erik S. Daniel
- Applicant Address: US MN Rochester
- Assignee: Mayo Foundation for Medical Education and Research
- Current Assignee: Mayo Foundation for Medical Education and Research
- Current Assignee Address: US MN Rochester
- Agency: Shumaker & Sieffert, P.A.
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/40

Abstract:
Techniques for bisecting a symmetric, substantially transmissive two-port network (a THRU structure) through an optimization solution of the relevant equations defined by transmission matrix mathematics are described. Bisect de-embedding may be performed using a single substantially symmetric THRU structure, a first half of a first substantially symmetric THRU structure and a second half of a second substantially symmetric THRU structure, and by combining bisect de-embedding with conventionally known de-embedding techniques.
Public/Granted literature
- US20060056310A1 Bisect de-embedding for network analyzer measurement Public/Granted day:2006-03-16
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