Invention Grant
US07643964B2 Method, system and apparatus for measuring an idle value of a central processing unit 有权
用于测量中央处理单元的空闲值的方法,系统和装置

  • Patent Title: Method, system and apparatus for measuring an idle value of a central processing unit
  • Patent Title (中): 用于测量中央处理单元的空闲值的方法,系统和装置
  • Application No.: US11892205
    Application Date: 2007-08-21
  • Publication No.: US07643964B2
    Publication Date: 2010-01-05
  • Inventor: Vitaly Andrianov
  • Applicant: Vitaly Andrianov
  • Applicant Address: US TX Dallas
  • Assignee: Texas Instruments Incorporated
  • Current Assignee: Texas Instruments Incorporated
  • Current Assignee Address: US TX Dallas
  • Agent Steven A. Shaw; W. James Brady; Frederick J. Telecky, Jr.
  • Main IPC: G04F10/00
  • IPC: G04F10/00
Method, system and apparatus for measuring an idle value of a central processing unit
Abstract:
In a method, system and apparatus for measuring an idle value of a Central Processing Unit (CPU) in an embedded system, the CPU increments a hardware counter in accordance with clock signals. The CPU also increments an idle counter during a predetermined period of time in accordance with the clock signals while an idle task is running. The CPU calculates the idle value as a ratio of total increments of the idle counter to total increments of the hardware counter after the predetermined period of time has expired.
Information query
Patent Agency Ranking
0/0