Invention Grant
US07643964B2 Method, system and apparatus for measuring an idle value of a central processing unit
有权
用于测量中央处理单元的空闲值的方法,系统和装置
- Patent Title: Method, system and apparatus for measuring an idle value of a central processing unit
- Patent Title (中): 用于测量中央处理单元的空闲值的方法,系统和装置
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Application No.: US11892205Application Date: 2007-08-21
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Publication No.: US07643964B2Publication Date: 2010-01-05
- Inventor: Vitaly Andrianov
- Applicant: Vitaly Andrianov
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Steven A. Shaw; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: G04F10/00
- IPC: G04F10/00

Abstract:
In a method, system and apparatus for measuring an idle value of a Central Processing Unit (CPU) in an embedded system, the CPU increments a hardware counter in accordance with clock signals. The CPU also increments an idle counter during a predetermined period of time in accordance with the clock signals while an idle task is running. The CPU calculates the idle value as a ratio of total increments of the idle counter to total increments of the hardware counter after the predetermined period of time has expired.
Public/Granted literature
- US20090055113A1 Method, system and apparatus for measuring an idle value of a central processing unit Public/Granted day:2009-02-26
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