Invention Grant
US07644331B2 System and method for testing and debugging analog circuits in a memory controller
有权
用于测试和调试存储器控制器中的模拟电路的系统和方法
- Patent Title: System and method for testing and debugging analog circuits in a memory controller
- Patent Title (中): 用于测试和调试存储器控制器中的模拟电路的系统和方法
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Application No.: US11190664Application Date: 2005-07-27
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Publication No.: US07644331B2Publication Date: 2010-01-05
- Inventor: Benjamin Haugestuen
- Applicant: Benjamin Haugestuen
- Applicant Address: SG Singapore
- Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H03L7/00 ; H03L7/06
Abstract:
A method and apparatus is presented for debugging and testing a memory controller. In one embodiment, a testing interface is presented for performing stuck-at testing. In a second embodiment, a testing interface is presented for observing clock timing in a memory controller.
Public/Granted literature
- US20070024630A1 System and method for testing and debugging analog circuits in a memory controller Public/Granted day:2007-02-01
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