An electronics component cabinet cover test device includes a housing that defines a test apparatus provided with first and second openings. A cover member is mounted to one of the openings, and an air moving device is arranged in the test apparatus. The air moving device includes an air inlet and an air outlet and generates airflow within the test apparatus. A sensor capable of measuring a characteristic of the airflow is mounted within the test apparatus. An airflow impedance device mounted to the inlet or the outlet of the air moving device. The airflow impedance device is configured to simulate an airflow obstruction. A controller establishes a flow rate of air from the air moving device and receives airflow data corresponding to the characteristic of the airflow from the sensor to determine one of an acoustical performance characteristic and a thermal performance characteristic of the cover member.