Invention Grant
- Patent Title: Uniform cavitation for particle removal
- Patent Title (中): 用于颗粒去除的均匀空化
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Application No.: US10559894Application Date: 2004-06-03
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Publication No.: US07645343B2Publication Date: 2010-01-12
- Inventor: Gary W. Ferrell , John F. Schipper , Jagjit S. Ratra
- Applicant: Gary W. Ferrell , Frances Ferrell, legal representative , John F. Schipper , Jagjit S. Ratra
- Applicant Address: US CA Fremont
- Assignee: SEZ America, Inc.
- Current Assignee: SEZ America, Inc.
- Current Assignee Address: US CA Fremont
- Agency: Schneck & Schneck
- Agent Thomas Schneck
- International Application: PCT/EP2004/051020 WO 20040603
- International Announcement: WO2004/110657 WO 20041223
- Main IPC: B08B3/10
- IPC: B08B3/10

Abstract:
Systems and methods for promoting a substantially uniform cavitation field. With system (100) including a diaphragm (109) dividing a container (103), a second energy pulse corresponding to a first energy pulse arising from collapse of a cavity C is produced and is used to determine whether to adjust a corresponding transducer 121-k. In system (16), a cavity creating unit (11), including an assembly of transducers 15-i, is moveable from a test liquid to a particle removal (PR) liquid after transducer testing. In another system, a sensor plate (170) having an array of sensors 171-j provides a virtual wafer. A substantially uniform field of cavitation may be maintained by a cavity enhancement liquid, or adjustment of transducer energy. Mechanisms of holding an object produce substantially uniform cavitation. Opposed transducers in a container having monotonically decreasing and/or increasing cavitation density produce substantially uniform cavitation density.
Public/Granted literature
- US20060290235A1 Uniform cavitation for particle removal Public/Granted day:2006-12-28
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