Invention Grant
- Patent Title: CMOS image sensor and method for fabricating the same
- Patent Title (中): CMOS图像传感器及其制造方法
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Application No.: US11507346Application Date: 2006-08-21
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Publication No.: US07645652B2Publication Date: 2010-01-12
- Inventor: Lim Keun Hyuk
- Applicant: Lim Keun Hyuk
- Applicant Address: KR Seoul
- Assignee: Dongbu Electronics Co., Ltd.
- Current Assignee: Dongbu Electronics Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Saliwanchik, Lloyd & Saliwanchik
- Priority: KR10-2005-0076800 20050822
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/338 ; H01L21/331

Abstract:
A CMOS image sensor and a method of fabricating the same are provided. The CMOS image sensor includes: a semiconductor substrate of a first conductivity type having a photodiode region and a transistor region defined therein; a gate electrode formed above the transistor region of the semiconductor substrate with a gate insulating layer interposed therebetween; a first impurity region formed of the first conductivity type in the semiconductor substrate below the gate electrode and having a higher concentration of first conductivity type ions than the semiconductor substrate; and a second impurity region formed of a second conductivity type in the photodiode region of the semiconductor substrate.
Public/Granted literature
- US20070051990A1 CMOS image sensor and method for fabricating the same Public/Granted day:2007-03-08
Information query
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