Invention Grant
- Patent Title: Integrated parallel plate capacitors
- Patent Title (中): 集成并联板电容器
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Application No.: US11275544Application Date: 2006-01-13
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Publication No.: US07645675B2Publication Date: 2010-01-12
- Inventor: Douglas D. Coolbaugh , Hanyi Ding , Ebenezer E. Eshun , Michael D. Gordon , Zhong-Xiang He , Anthony K. Stamper
- Applicant: Douglas D. Coolbaugh , Hanyi Ding , Ebenezer E. Eshun , Michael D. Gordon , Zhong-Xiang He , Anthony K. Stamper
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Anthony J. Canale
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A parallel plate capacitor formed in the back end of an integrated circuit employs conductive capacitor plates that are formed simultaneously with the other interconnects on that level of the back end (having the same material, thickness, etc). The capacitor plates are set into the interlevel dielectric using the same process as the other interconnects on that level of the back end (preferably dual damascene). Some versions of the capacitors have perforations in the plates and vertical conductive members connecting all plates of the same polarity, thereby increasing reliability, saving space and increasing the capacitive density compared with solid plates.
Public/Granted literature
- US20070190760A1 INTEGRATED PARALLEL PLATE CAPACITORS Public/Granted day:2007-08-16
Information query
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