A semiconductor device includes bit lines (14) provided in a semiconductor substrate (10), word lines (16) provided above the bit lines and running in a width direction of the bit lines (14), metal lines (22) provided above the word lines (16) and running in a length direction of the bit lines (14), and bit line contact regions (28) running in the length direction of the word lines (16) and located between word line regions (26) in which a plurality of word lines (16) are disposed. Each of the bit lines (14) is connected with every other metal line (22) in the bit line contact regions (28). It is thus possible to provide a semiconductor device and a fabrication method therefor in which an alignment margin can be ensured between a contact hole (18) and the bit line (14) to enable downsizing of a memory cell.