Invention Grant
- Patent Title: Measuring device, measuring apparatus and method of measuring
- Patent Title (中): 测量装置,测量装置和测量方法
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Application No.: US11995473Application Date: 2006-10-24
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Publication No.: US07646474B2Publication Date: 2010-01-12
- Inventor: Takahiro Nakaminami , Akihito Kamei , Atsushi Fukunaga
- Applicant: Takahiro Nakaminami , Akihito Kamei , Atsushi Fukunaga
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2005-314963 20051028; JP2005-319714 20051102
- International Application: PCT/JP2006/321147 WO 20061024
- International Announcement: WO2007/049607 WO 20070503
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A measuring device for analyzing an analyte contained in a sample. The device includes a hollow housing, a sample holding part provided inside the housing for holding the sample, a sample supply inlet provided for the housing so as to communicate with the sample holding part, an optical measurement part provided for the sample holding part for making an optical measurement, a reagent holding part provided for the sample holding part for holding a reagent for the optical measurement, and at least one electrode provided on an outer surface of the housing.
Public/Granted literature
- US20090219514A1 MEASURING DEVICE, MEASURING APPARATUS AND METHOD OF MEASURING Public/Granted day:2009-09-03
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