Invention Grant
- Patent Title: Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase shifting point-diffraction interferometry
- Patent Title (中): 使用相移点衍射干涉法的光学系统的空间脉冲响应的原位和非原位测量的装置和方法
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Application No.: US11881141Application Date: 2007-07-25
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Publication No.: US07646490B2Publication Date: 2010-01-12
- Inventor: Henry A. Hill
- Applicant: Henry A. Hill
- Applicant Address: US AZ Tucson
- Assignee: Zetetic Institute
- Current Assignee: Zetetic Institute
- Current Assignee Address: US AZ Tucson
- Agency: Wilmer Cutler Pickering Hale & Dorr LLP.
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01B11/02
Abstract:
A test object including: an arrangement of optical elements defining a first partially reflecting surface and a second partially reflecting surface, at least one of the first and second partially reflecting surfaces being curved, wherein the first partially reflecting surface is arranged to receive a substantially collimated input beam and produce therefrom a first transmitted beam that passes on to the second partially reflecting surface, wherein the second partially reflecting surface is arranged to receive the first transmitted beam from the first partially reflecting surface and produce a collimated second transmitted beam and a first reflected beam therefrom, wherein the first partially reflecting surface is arranged to receive the first reflected beam and produce a second reflected beam therefrom, and wherein the first and second reflecting surfaces are configured to cause the second reflecting beam to converge onto a spot on a back surface to produce a diverging beam traveling in the same direction as the collimated output beam.
Public/Granted literature
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