Invention Grant
US07646835B1 Method and system for automatically calibrating intra-cycle timing relationships for sampling signals for an integrated circuit device
有权
用于自动校准用于集成电路器件的采样信号的周期内定时关系的方法和系统
- Patent Title: Method and system for automatically calibrating intra-cycle timing relationships for sampling signals for an integrated circuit device
- Patent Title (中): 用于自动校准用于集成电路器件的采样信号的周期内定时关系的方法和系统
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Application No.: US10716320Application Date: 2003-11-17
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Publication No.: US07646835B1Publication Date: 2010-01-12
- Inventor: Guillermo J. Rozas
- Applicant: Guillermo J. Rozas
- Main IPC: H04L7/00
- IPC: H04L7/00
Abstract:
A method for automatically calibrating intra-cycle timing relationships between command signals, data signals, and sampling signals for an integrated circuit device. The method includes generating command signals for accessing an integrated circuit component, accessing data signals for conveying data for the integrated circuit component, and accessing sampling signals for controlling the sampling of the data signals. A phase relationship between the command signals, the data signals, and the sampling signals is automatically adjusted to calibrate operation of the integrated circuit device.
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