Invention Grant
- Patent Title: Dynamic determination of sampling rates
- Patent Title (中): 动态测定采样率
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Application No.: US11371764Application Date: 2006-03-09
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Publication No.: US07647131B1Publication Date: 2010-01-12
- Inventor: Randall P. Sadowski , John T. Campbell, Jr. , Mark A. Glavach , Scott A. Miller , Keith A. Overstreet , David T. Sturrock
- Applicant: Randall P. Sadowski , John T. Campbell, Jr. , Mark A. Glavach , Scott A. Miller , Keith A. Overstreet , David T. Sturrock
- Applicant Address: US OH Mayfield Heights
- Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee Address: US OH Mayfield Heights
- Agency: Turocy & Watson LLP
- Agent William R. Walbrun
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/18

Abstract:
A system that facilitates determination of a sampling rate to utilize in connection with sampling data in an industrial environment comprises a receiver component that receives data from an I/O port of a controller. An analysis component automatically and dynamically determines a rate at which data associated with the I/O port is to be sampled based at least in part upon the received data. The system can further comprise a sampling component that samples data at the rate determined by the analysis component.
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