Invention Grant
- Patent Title: Event-driven test framework
- Patent Title (中): 事件驱动的测试框架
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Application No.: US11178570Application Date: 2005-07-11
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Publication No.: US07647219B2Publication Date: 2010-01-12
- Inventor: James M. Overturf , Lajos Molnar
- Applicant: James M. Overturf , Lajos Molnar
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Mark G. Abyad; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/45 ; G06F9/44 ; G06F11/00
Abstract:
A modular instance-aware event-driven test framework is described. It includes an event-driven test framework, a transition-graph test model for the event-driven text framework, an instance-aware event-driven test framework built on said event-driven test framework and a transition-graph test model for said instance-aware event-driven test framework built on said transition-graph test model.
Public/Granted literature
- US20070074166A1 Event-driven test framework Public/Granted day:2007-03-29
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