Invention Grant
- Patent Title: Integrated system for simultaneous inspection and manipulation
- Patent Title (中): 集成系统同时进行检查和操作
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Application No.: US11564678Application Date: 2006-11-29
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Publication No.: US07647848B2Publication Date: 2010-01-19
- Inventor: Bradley E. Layton , Gregory Buzby
- Applicant: Bradley E. Layton , Gregory Buzby
- Applicant Address: US PA Philadelphia
- Assignee: Drexel University
- Current Assignee: Drexel University
- Current Assignee Address: US PA Philadelphia
- Agency: Knoble, Yoshida & Dunleavy, LLC
- Main IPC: G01M19/00
- IPC: G01M19/00

Abstract:
A base unit for integrating an imaging device, such as an atomic force microscope, and a manipulation device, such as a nano-manipulator. The integration of the two devices permits one device to perform both imaging and manipulation simultaneously. The simultaneous execution of these two tasks increases the rate at which experiments can be conducted, thereby improving the throughput of the device. Also, the simultaneous execution of these two tasks allows imaging during manipulation, which may be desirable or beneficial in some circumstances.
Public/Granted literature
- US20070227273A1 INTEGRATED SYSTEM FOR SIMULTANEOUS INSPECTION AND MANIPULATION Public/Granted day:2007-10-04
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