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US07647848B2 Integrated system for simultaneous inspection and manipulation 失效
集成系统同时进行检查和操作

Integrated system for simultaneous inspection and manipulation
Abstract:
A base unit for integrating an imaging device, such as an atomic force microscope, and a manipulation device, such as a nano-manipulator. The integration of the two devices permits one device to perform both imaging and manipulation simultaneously. The simultaneous execution of these two tasks increases the rate at which experiments can be conducted, thereby improving the throughput of the device. Also, the simultaneous execution of these two tasks allows imaging during manipulation, which may be desirable or beneficial in some circumstances.
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