Invention Grant
- Patent Title: Systems and methods for temperature measurement using n-factor coefficient correction
- Patent Title (中): 使用n因子系数校正的温度测量系统和方法
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Application No.: US11738595Application Date: 2007-04-23
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Publication No.: US07648271B2Publication Date: 2010-01-19
- Inventor: Jerry L. Doorenbos , Marco A. Gardner
- Applicant: Jerry L. Doorenbos , Marco A. Gardner
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John J. Patti; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G01K7/00
- IPC: G01K7/00 ; G01K15/00

Abstract:
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages.
Public/Granted literature
- US20080259989A1 Systems and Methods for Temperature Measurement Using N-Factor Coefficient Correction Public/Granted day:2008-10-23
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