Invention Grant
- Patent Title: Dual-polarity mass spectrometer
- Patent Title (中): 双极性质谱仪
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Application No.: US11542568Application Date: 2006-10-03
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Publication No.: US07649170B2Publication Date: 2010-01-19
- Inventor: Yi-Sheng Wang , Chung-Hsuan Chen , Shang-Ting Tsai , Chiu Wen Chen
- Applicant: Yi-Sheng Wang , Chung-Hsuan Chen , Shang-Ting Tsai , Chiu Wen Chen
- Applicant Address: TW Taipei
- Assignee: Academia Sinica
- Current Assignee: Academia Sinica
- Current Assignee Address: TW Taipei
- Agency: Fish & Richardson P.C.
- Main IPC: H01J49/10
- IPC: H01J49/10

Abstract:
A dual-polarity mass spectrometer includes an ion source, a negative ion mass analyzer, and a positive ion mass analyzer to measure both the negative and positive ion spectra of a sample material simultaneously. The ion source includes a sample surface on which the sample material is positioned, the sample material providing positive ions and negative ions when excited by a laser beam or an energetic particle stream. A first extraction electrode is connected to a voltage higher than the sample surface to attract the negative ions from the sample electrode. A second extraction electrode is connected to a voltage lower than the sample surface to attract the positive ions from the sample electrode. The negative and positive ions are analyzed simultaneously by the negative ion mass analyzer and the positive ion mass analyzer, respectively.
Public/Granted literature
- US20080078928A1 Dual-polarity mass spectrometer Public/Granted day:2008-04-03
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