Invention Grant
- Patent Title: Multi-stage waveform detector
- Patent Title (中): 多级波形检测器
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Application No.: US12079735Application Date: 2008-03-28
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Publication No.: US07649180B2Publication Date: 2010-01-19
- Inventor: Roderick A. Hyde , Muriel Y. Ishikawa , Edward K. Y. Jung , Nathan P. Myhrvold , Clarence T. Tegreene , Lowell L. Wood, Jr.
- Applicant: Roderick A. Hyde , Muriel Y. Ishikawa , Edward K. Y. Jung , Nathan P. Myhrvold , Clarence T. Tegreene , Lowell L. Wood, Jr.
- Assignee: Searete LLC
- Current Assignee: Searete LLC
- Main IPC: G01J1/42
- IPC: G01J1/42
Abstract:
A waveform detector may include multiple stages.
Public/Granted literature
- US20080185531A1 Multi-stage waveform detector Public/Granted day:2008-08-07
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