Invention Grant
- Patent Title: Nitride semiconductor free-standing substrate
- Patent Title (中): 氮化物半导体自立式基板
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Application No.: US11541790Application Date: 2006-10-03
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Publication No.: US07649194B2Publication Date: 2010-01-19
- Inventor: Takehiro Yoshida
- Applicant: Takehiro Yoshida
- Applicant Address: JP Tokyo
- Assignee: Hitachi Cable, Ltd.
- Current Assignee: Hitachi Cable, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2006-164573 20060614
- Main IPC: H01L29/12
- IPC: H01L29/12 ; H01L31/12 ; H01L33/00

Abstract:
A nitride semiconductor free-standing substrate formed of a free-standing nitride-based compound semiconductor crystal that has a variation in lattice constant of ±12 ppm or less.
Public/Granted literature
- US20070290228A1 Nitride semiconductor free-standing substrate Public/Granted day:2007-12-20
Information query
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