Invention Grant
- Patent Title: Image sensor and method of manufacturing the same
- Patent Title (中): 图像传感器及其制造方法
-
Application No.: US11842580Application Date: 2007-08-21
-
Publication No.: US07649219B2Publication Date: 2010-01-19
- Inventor: Seong Gyun Kim
- Applicant: Seong Gyun Kim
- Applicant Address: KR Seoul
- Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Saliwanchik, Lloyd & Saliwanchik
- Priority: KR10-2007-0039099 20070423
- Main IPC: H01L31/062
- IPC: H01L31/062

Abstract:
An image sensor and a method of manufacturing the same are provided. The image sensor includes a semiconductor substrate, a metal line layer, a first conduction type conducting layer, a first pixel isolation layer, an intrinsic layer, and second conduction type conducting layer. The semiconductor substrate includes a circuit region. The metal line layer including a plurality of metal lines and an interlayer insulating layer is formed on the semiconductor substrate. The first conductive layer having patterns separated from each other by the pixel isolation layer is formed on the metal lines. The first pixel isolation layer is formed between the separated patterns of the first conduction type conducting layer. The intrinsic layer is formed on the first conductive layer and the first pixel isolation layer. The second conduction type conducting layer is formed on the intrinsic layer.
Public/Granted literature
- US20080258189A1 Image Sensor and Method of Manufacturing the Same Public/Granted day:2008-10-23
Information query
IPC分类: