Invention Grant
- Patent Title: Soft error rate hardened latch
- Patent Title (中): 软错误率硬化锁存器
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Application No.: US11905293Application Date: 2007-09-28
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Publication No.: US07649396B2Publication Date: 2010-01-19
- Inventor: Balkaran Gill , Norbert Seifert
- Applicant: Balkaran Gill , Norbert Seifert
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: KED & Associates, LLP
- Main IPC: H03K3/00
- IPC: H03K3/00

Abstract:
A latch is provided that includes a first inverter, a second inverter, a first latch circuit and a second latch circuit. The first inverter to receive the first clock signal from an input port and to provide a clock signal. The second inverter to receive the first clock signal from the input port and to provide a clock signal. The first latch circuit is to store data and to receive a clock signal from the second inverter. The second latch circuit is further to store data and to receive a clock signal from the first inverter.
Public/Granted literature
- US20090085627A1 Soft error rate hardened latch Public/Granted day:2009-04-02
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