Invention Grant
- Patent Title: Wavelength calibration method and wavelength calibration apparatus
- Patent Title (中): 波长校准方法和波长校准装置
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Application No.: US11703643Application Date: 2007-02-08
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Publication No.: US07649627B2Publication Date: 2010-01-19
- Inventor: Toshikazu Yamamoto
- Applicant: Toshikazu Yamamoto
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-041082 20060217
- Main IPC: G01J3/26
- IPC: G01J3/26

Abstract:
In a wavelength calibration method, an observed spectrum of a light that has a wavelength band is obtained, wherein the light has at least an attenuated wavelength component that corresponds to at least a predetermined absorption wavelength that is included in the wavelength band. A corrected spectrum is then obtained from the observed spectrum, wherein the corrected spectrum has reduced dependencies upon the full width at half maximum of an emission band of the light and upon an intensity ripple period of the light.
Public/Granted literature
- US20070195318A1 Wavelength calibration method and wavelength calibration apparatus Public/Granted day:2007-08-23
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