Invention Grant
- Patent Title: Flash memory device and related high voltage generating circuit
- Patent Title (中): 闪存器件及相关高压发生电路
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Application No.: US11785309Application Date: 2007-04-17
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Publication No.: US07649785B2Publication Date: 2010-01-19
- Inventor: Dae-Seok Byeon
- Applicant: Dae-Seok Byeon
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2006-0046669 20060524
- Main IPC: G11C11/03
- IPC: G11C11/03

Abstract:
A flash memory device is disclosed and includes; a memory cell array, a high voltage generating circuit generating a high voltage applied to a selected word line to select one or more memory cells in the memory cell array, and a controller. The controller cuts off a discharge path between the high voltage generating circuit and ground during a first period wherein the high voltage is not applied to a word line. The controller also deactivates the high voltage generating circuit during this first period.
Public/Granted literature
- US20070274133A1 Flash memory device and related high voltage generating circuit Public/Granted day:2007-11-29
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