Invention Grant
- Patent Title: Self-testing optical transceiver controller using internalized loopbacks
- Patent Title (中): 使用内部环回的自检光收发器控制器
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Application No.: US11320182Application Date: 2005-12-28
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Publication No.: US07650070B2Publication Date: 2010-01-19
- Inventor: Jayne C. Hahin , Gerald L. Dybsetter , Luke M. Ekkizogloy
- Applicant: Jayne C. Hahin , Gerald L. Dybsetter , Luke M. Ekkizogloy
- Applicant Address: US CA Sunnyvale
- Assignee: Finisar Corporation
- Current Assignee: Finisar Corporation
- Current Assignee Address: US CA Sunnyvale
- Agency: Workman Nydegger
- Main IPC: H04B10/00
- IPC: H04B10/00 ; H04B10/08

Abstract:
An operational optical transceiver microcontroller configured to initiate a self-test using internalized loop backs. The microcontroller includes a memory, at least one processor and a number of input and output terminals. The output terminals are coupled to internally corresponding input terminals by a configurable switch. The memory receives microcode that, when executed by the processor, causes the microcontroller to close the switches so as to internally connect the output and input terminals. A signal is then asserted on the output terminal. This signal loops back and is received by the input terminal. The processor may then detect the microcontroller's response to the signal.
Public/Granted literature
- US20060147217A1 Self-testing optical transceiver controller using internalized loopbacks Public/Granted day:2006-07-06
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