Invention Grant
- Patent Title: Estimating an attribute value using spatial interpolation and masking zones
- Patent Title (中): 使用空间插值和掩蔽区域估计属性值
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Application No.: US11767039Application Date: 2007-06-22
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Publication No.: US07650240B2Publication Date: 2010-01-19
- Inventor: Jeffrey J Welty
- Applicant: Jeffrey J Welty
- Applicant Address: US WA Federal Way
- Assignee: Weyerhaeuser NR Company
- Current Assignee: Weyerhaeuser NR Company
- Current Assignee Address: US WA Federal Way
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01V3/38
- IPC: G01V3/38

Abstract:
Aspects of the present invention are directed at estimating the value of an attribute at a specified geographic location. In one embodiment, a method is provided that estimates the elevation at a principal point using LiDAR data that was collected from spatially related secondary points. More specifically, the method includes identifying secondary points where sample attribute data was obtained that are within a predetermined distance to the principal point where the attribute is being estimated. A secondary point may be selected and allocated a masking zone and a determination made regarding whether one or more distant secondary points are within the area of the masking zone. In this regard, more distant secondary points that are inside a masking zone may be assigned less relevance when estimating the value of the attribute.
Public/Granted literature
- US20080319672A1 Estimating an attribute value using spatial interpolation and masking zones Public/Granted day:2008-12-25
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