Invention Grant
US07650535B2 Array delete mechanisms for shipping a microprocessor with defective arrays 失效
用于运送有缺陷阵列的微处理器的阵列删除机制

Array delete mechanisms for shipping a microprocessor with defective arrays
Abstract:
Detecting and correcting errors in arrays after ABIST testing, after ABIST testing, detected errors are faults are isolated by blowing a fuse.
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