Invention Grant
- Patent Title: Inspection support apparatus and inspection support method
- Patent Title (中): 检验支援设备及检验支援方式
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Application No.: US11639279Application Date: 2006-12-15
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Publication No.: US07650537B2Publication Date: 2010-01-19
- Inventor: Takao Shin , Shunya Kuwano
- Applicant: Takao Shin , Shunya Kuwano
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Fujitsu Microelectronics Limited,Fujitsu Devices Inc.
- Current Assignee: Fujitsu Microelectronics Limited,Fujitsu Devices Inc.
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Arent Fox LLP
- Priority: JP2006-205400 20060727
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
To enable measurement of a suspension position and a suspension period of the reference clock of a microcomputer to be inspected, based on the information stored into a clock information register section, by acquiring output data output from the microcomputer; preserving the acquired output data into a data bank section by use of the reference clock being output from the microcomputer together with the output data; discriminating the suspension of the reference clock by a clock operation discrimination section at sampling intervals of the output data; and writing and preserving the discrimination result into the clock information register section by a register control section.
Public/Granted literature
- US20080126821A1 Inspection support apparatus and inspection support method Public/Granted day:2008-05-29
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