Invention Grant
- Patent Title: Test mode control circuit
- Patent Title (中): 测试模式控制电路
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Application No.: US12209966Application Date: 2008-09-12
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Publication No.: US07650544B2Publication Date: 2010-01-19
- Inventor: Ji-Eun Jang , Kee-Teok Park
- Applicant: Ji-Eun Jang , Kee-Teok Park
- Applicant Address: KR Kyoungki-Do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Kyoungki-Do
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Priority: KR10-2005-0079598 20050829
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
Provided is a test mode control circuit capable of preventing an MRS (mode register set) from changing in a test mode exit after a test mode entry. In the test mode control circuit, an MRS controller logically combines an MRS signal, a bank address, an MRS address, and a test mode control signal to output a latch control signal. A test mode control unit detects a test mode entry and a test mode exit to selectively activate one of a test mode set signal and a test mode exit signal, and outputs the test mode control signal having different voltage levels according to an activation state of the test mode set signal or the test mode exit signal. An address latch latches an input address when the MRS signal is activated, and outputs the latched input address as the MRS address when the latch control signal is activated.
Public/Granted literature
- US20090013225A1 TEST MODE CONTROL CIRCUIT Public/Granted day:2009-01-08
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