Invention Grant
US07650547B2 Apparatus for locating a defect in a scan chain while testing digital logic
有权
用于在测试数字逻辑时定位扫描链中的缺陷的装置
- Patent Title: Apparatus for locating a defect in a scan chain while testing digital logic
- Patent Title (中): 用于在测试数字逻辑时定位扫描链中的缺陷的装置
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Application No.: US11680134Application Date: 2007-02-28
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Publication No.: US07650547B2Publication Date: 2010-01-19
- Inventor: Phillip D. Burlison , John K. Frediani
- Applicant: Phillip D. Burlison , John K. Frediani
- Applicant Address: SG Singapore
- Assignee: Verigy (Singapore) Pte. Ltd.
- Current Assignee: Verigy (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Holland & Hart, LLP
- Main IPC: G01R31/3183
- IPC: G01R31/3183 ; G01R31/40
Abstract:
An apparatus for locating a defect in a scan chain by recording the last bit position in a serial data stream at which a certain data state is observed during a test comprising a plurality of patterns.
Public/Granted literature
- US20080209288A1 APPARATUS FOR LOCATING A DEFECT IN A SCAN CHAIN WHILE TESTING DIGITAL LOGIC Public/Granted day:2008-08-28
Information query
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