Invention Grant
- Patent Title: Over temperature detection apparatus and method thereof
- Patent Title (中): 过温度检测装置及其方法
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Application No.: US11679242Application Date: 2007-02-27
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Publication No.: US07650550B2Publication Date: 2010-01-19
- Inventor: Ravi Ramaswami , Michael D. Bienek
- Applicant: Ravi Ramaswami , Michael D. Bienek
- Assignee: GlobalFoundries Inc.
- Current Assignee: GlobalFoundries Inc.
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/40

Abstract:
A device is provided for detecting temperature-induced delays in a combinational logic path. A signal at the output of the logic path is latched at a first latch using a primary clock signal. The primary clock signal is delayed by a delay element to provide a delayed clock signal. The output of the logic path is latched at a second latch using the delayed clock signal. The delay element delays the clock signal by an amount that indicates the occurrence of an over-temperature condition at the logic path. A comparator compares the data latched at the first latch to the data latched at the second latch and provides an error signal indicative of an over-temperature condition if the first and second latch contain different data values.
Public/Granted literature
- US20080209291A1 OVER TEMPERATURE DETECTION APPARATUS AND METHOD THEREOF Public/Granted day:2008-08-28
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