Invention Grant
- Patent Title: Error detection and recovery within processing stages of an integrated circuit
- Patent Title (中): 集成电路处理阶段内的错误检测和恢复
-
Application No.: US11889759Application Date: 2007-08-16
-
Publication No.: US07650551B2Publication Date: 2010-01-19
- Inventor: Krisztian Flautner , Todd Michael Austin , David Theodore Blaauw , Trevor Nigel Mudge
- Applicant: Krisztian Flautner , Todd Michael Austin , David Theodore Blaauw , Trevor Nigel Mudge
- Applicant Address: GB Cambridge US MI Ann Arbor
- Assignee: ARM Limited,University of Michigan
- Current Assignee: ARM Limited,University of Michigan
- Current Assignee Address: GB Cambridge US MI Ann Arbor
- Agency: Nixon & Vanderhye P.C.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G11C29/00

Abstract:
An integrated circuit includes a plurality of processing stages each including processing logic 2, a non-delayed latch 4, a delayed latch 8 and a comparator 6. The non-delayed latch 4 captures an output from the processing logic 2 at a non-delayed capture time. At a later delayed capture time, the delayed latch 8 also captures a value from the processing logic 2. The comparator 6 compares these values and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.
Public/Granted literature
- US20070288798A1 Error detection and recovery within processing stages of an integrated circuit Public/Granted day:2007-12-13
Information query