Invention Grant
- Patent Title: Semiconductor integrated circuit apparatus and interface test method
- Patent Title (中): 半导体集成电路设备及接口测试方法
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Application No.: US11319515Application Date: 2005-12-29
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Publication No.: US07650553B2Publication Date: 2010-01-19
- Inventor: Kazufumi Komura
- Applicant: Kazufumi Komura
- Applicant Address: JP Tokyo
- Assignee: Fujitsu Microelectronics Limited
- Current Assignee: Fujitsu Microelectronics Limited
- Current Assignee Address: JP Tokyo
- Agency: Arent Fox LLP
- Priority: JP2005-288824 20050930
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An interface test can be performed by, for example, only a self apparatus when interface operation specifications are different between the self apparatus and an original connection partner apparatus. An LSI has a plurality of interfaces (IFs) for transmission/reception of data with an external device, and the LSI includes an emulation control unit for allowing one of the two of the plurality of IFs to perform an operation of emulating an IF of a connection partner device having operation specifications different from those of the LSI, when two IFs are connected to each other via a transmission line.
Public/Granted literature
- US20070079198A1 Semiconductor integrated circuit apparatus and interface test method Public/Granted day:2007-04-05
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