Invention Grant
- Patent Title: Thermal type flow rate measuring apparatus
- Patent Title (中): 热式流量测量仪
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Application No.: US12139761Application Date: 2008-06-16
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Publication No.: US07650784B2Publication Date: 2010-01-26
- Inventor: Izumi Watanabe , Junichi Horie , Keiichi Nakada , Kei Ueyama , Masamichi Yamada
- Applicant: Izumi Watanabe , Junichi Horie , Keiichi Nakada , Kei Ueyama , Masamichi Yamada
- Applicant Address: JP Tokyo JP Hitachinaka-shi
- Assignee: Hitachi, Ltd.,Hitachi Car Engineering Co., Ltd.
- Current Assignee: Hitachi, Ltd.,Hitachi Car Engineering Co., Ltd.
- Current Assignee Address: JP Tokyo JP Hitachinaka-shi
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2002-168008 20020610
- Main IPC: G01F1/68
- IPC: G01F1/68

Abstract:
A flow rate sensor has a problem that a resistance value of a heat generating resistor itself varies and sensor characteristics are changed during use of the sensor for a long term. Also, the temperature of the heat generating resistor must be adjusted on a circuit substrate with a resistance constituting one side of a fixed temperature difference control circuit, and this has been one of factors pushing up the production cost. All resistances used for fixed temperature difference control are formed on the same substrate as temperature sensitive resistors of the same material. This enables all the resistances for the fixed temperature difference control to be exposed to the same environmental conditions. Hence, even when the resistances change over time, the changes over time occur substantially at the same tendency. Since the resistances for the fixed temperature difference control change over time essentially at the same rate, a resulting output error is very small.
Public/Granted literature
- US20080250856A1 THERMAL TYPE FLOW RATE MEASURING APPARATUS Public/Granted day:2008-10-16
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