Invention Grant
- Patent Title: Analyzing tool with knob part
- Patent Title (中): 用旋钮部分分析工具
-
Application No.: US10545394Application Date: 2004-02-13
-
Publication No.: US07651595B2Publication Date: 2010-01-26
- Inventor: Shigeru Doi , Yoshimitsu Morita
- Applicant: Shigeru Doi , Yoshimitsu Morita
- Applicant Address: JP Kyoto
- Assignee: Arkray, Inc.
- Current Assignee: Arkray, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: JP2003-037031 20030214
- International Application: PCT/JP2004/001594 WO 20040213
- International Announcement: WO2004/072632 WO 20040826
- Main IPC: G01N27/403
- IPC: G01N27/403 ; G01N27/327 ; G01N27/333
Abstract:
The present invention relates to a test tool (X1) attached to an analyzing device (1) for analyzing a sample. The test tool (X1) includes a pinching portion (6) for attachment to the analyzing device (1) or removal from the analyzing device (1). The pinching portion (6) may include recesses or projections.
Public/Granted literature
- US20060243589A1 Analyzing tool with knob part Public/Granted day:2006-11-02
Information query
