Invention Grant
- Patent Title: Adhesion layer for thin film magnetic recording medium
- Patent Title (中): 薄膜磁记录介质粘合层
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Application No.: US11118850Application Date: 2005-04-28
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Publication No.: US07651794B2Publication Date: 2010-01-26
- Inventor: Hong Deng , Yoshihiro Ikeda , Mary Frances Minardi , Kentaro Takano , Kai Tang
- Applicant: Hong Deng , Yoshihiro Ikeda , Mary Frances Minardi , Kentaro Takano , Kai Tang
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agent G. Marlin Knight
- Main IPC: G11B5/71
- IPC: G11B5/71 ; G11B5/708

Abstract:
The invention uses an adhesion layer of an amorphous alloy of aluminum. A first aluminum titanium embodiment of the amorphous adhesion layer preferably contains approximately equal amounts of aluminum and titanium (+/−5 at. %). A second embodiment of the amorphous adhesion layer preferably contains approximately equal amounts of aluminum and titanium (+/−5 at. %) and up to 10 at. % Zr with 5 at. % Zr being preferred. A third embodiment is aluminum tantalum preferably including from 15 to 25 at. % tantalum with 20 at. % being preferred. The most preferred compositions are Al50Ti50, Al47.5Ti47.5Zr5 or Al80 Ta20. The adhesion layer is deposited onto the substrate. The substrate can be glass or a metal such as NiP-plated AlMg. The preferred embodiment of media according to the invention is for perpendicular recording and includes a magnetically soft underlayer deposited above the adhesion layer.
Public/Granted literature
- US20060246324A1 Adhesion layer for thin film magnetic recording medium Public/Granted day:2006-11-02
Information query
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